Hostname: page-component-848d4c4894-pftt2 Total loading time: 0 Render date: 2024-05-15T05:26:42.831Z Has data issue: false hasContentIssue false
  • English
  • Français

Quantitative Assessment of Lower-Voltage TEM Performance Using 3D Fourier Transform of Through-Focus Series

Published online by Cambridge University Press:  27 August 2014

Koji Kimoto  and
Kazuo Ishizuka
Koji Kimoto
Affiliation:
National Institute for Materials Science, 1-1 Namiki, Tsukuba 305-0044, Japan.
Kazuo Ishizuka
Affiliation:
HREM Research Inc., 14-48 Matsukazedai, Higashimatsuyama 355-0055, Japan.

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 936 - 937
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Haider, M., et al, Nature 392 (1998) 768-769.Google Scholar
[2] Suenaga, K. el al, Nat. Nanotechnol. 2 (2007) 358-360.Google Scholar
[3] Kaiser, U., et al, Ultramicrosc. 111 (2011) 1239-1246.Google Scholar
[4] O’Keefe, M. A., Allard, L. F., Bolm, D. A. Microsc. Microanal. 15 (2009) 1470-1471.Google Scholar
[5] Haider, M., et al, Microsc. Microanal. 16 (2010) 393-408.Google Scholar
[6] Barthel, J., Thust, A. Phys. Rev. Lett. 1012008) 200801.Google Scholar
[7] Taniguchi, Y., Ikuta, T., Shimizu, R. J. Electron Microsc. 40 (1991) 5-10.Google Scholar
[8] Op, M. de Beeck, D. Van Dyck, W. Coene, Ultramicrosc. 64 (1996) 167-183.Google Scholar
[9] Kimoto, K., et al, Ultramicrosc. 121 (2012) 31-37.Google Scholar
[10] Sawada, H., et al, Ultramicrosc. 110 (2010) 958-961.Google Scholar
[11] Kimoto, K., et al, Ultramicrosc. 134 (2013) 86-93.Google Scholar
[12] We thank Drs. Nagai, Lazar, Freitag, Sawada, Sasaki, Ohwada, Sato and Suenaga for invaluable discussions. This work is partly supported by Nanotechnology Platform Project of MEXT Japan, and Research Acceleration Program of JSPS.Google Scholar