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Quantitative Electron-probe Microanalysis and WDS Background Measurement

Published online by Cambridge University Press:  27 August 2014

P. K. Carpenter  and
J. J. Donovan
P. K. Carpenter
Affiliation:
Dept. of Earth and Planetary Sciences, Washington University in St. Louis, Campus Box 1169, Saint Louis, MO, 63130, USA
J. J. Donovan
Affiliation:
CAMCOR, University of Oregon, Eugene, OR 97403, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 722 - 723
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Donovan, J. J. and Tingle, T. N. JMSA, 2, No.1 1996.Google Scholar