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Quantitative SEM-EDS Analysis of Semi-transparent Samples

Published online by Cambridge University Press:  30 July 2020

Stephen Boona
Stephen Boona*
Affiliation:
The Ohio State University, Columbus, Ohio, United States

Abstract

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Type
Advances in Quantitative Electron Beam Microanalysis (EDS and WDS)
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1558 - 1560
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Copyright
Copyright © Microscopy Society of America 2020

References

Schweizer, P. et al. , Microsc. Microanal. 25 (Suppl 2), p450 (2019)10.1017/S1431927619002988CrossRefGoogle Scholar
Keller, R.R. and Geiss, R.H., J. Microsc. 245 3, p245–251 (2012)10.1111/j.1365-2818.2011.03566.xCrossRefGoogle Scholar
Yamazawa, Y. et al. , Microsc. Microanal. 22 (Suppl 3), p50 (2016)10.1017/S1431927616001100CrossRefGoogle Scholar
The author gratefully acknowledges discussions with H. Colijn, D. Huber, R. Williams, and D. Veghte, as well as direct support from Ohio State's Center for Electron Microscopy and Analysis (CEMAS).Google Scholar