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Quantitative symmetry determination and symmetry mapping using convergent beam electron diffraction technique

Published online by Cambridge University Press:  23 September 2015

Kyou-Hyun Kim  and
Jian-Min Zuo
Kyou-Hyun Kim
Affiliation:
Advanced Process and Materials R&BD Group, Korea Institute of Industrial Technology, Incheon, 406-840, Korea
Jian-Min Zuo
Affiliation:
Department of Materials Science and Engineering, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, Urbana, Illinois 61801, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 821 - 822
Copyright
Copyright © Microscopy Society of America 2015 

References

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[2] Kim, K.-H., Payne, David A. & Zuo, J.-M., Phys. Rev. B 86 (2012) 184113.CrossRefGoogle Scholar
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[8] This work was supported by DOE (DEFG02-01ER45923). We thank Jerome Pacaud for providing the strained silicon sample.Google Scholar