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Quantitative X-ray Microanalysis of Particles at Low Beam Energy

Published online by Cambridge University Press:  24 July 2003

John A. Small
John A. Small*
Affiliation:
NIST, Surface and Microanalysis Science Division, Gaithersburg, MD 20899-8371

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 992 - 993
Copyright
Copyright © Microscopy Society of America 2003