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Radiation Damage on Liquid Electrolyte during Spatially Resolved Soft X-ray Photoemission Measurements

Published online by Cambridge University Press:  05 August 2019

Christopher Arble ,
Hongxuan Guo ,
Brian Hoskins ,
Matteo Amati ,
Patrick Zeller ,
Luca Gregoratti  and
Andrei Kolmakov
Christopher Arble*
Affiliation:
Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
Hongxuan Guo
Affiliation:
SEU-FEI Nano-Pico Center, Key Laboratory of MEMS of Ministry of Education, Southeast University, Nanjing 210096, P. R. China
Brian Hoskins
Affiliation:
Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
Matteo Amati
Affiliation:
Elettra Sincrotrone Trieste SCpA, SS14, Km163-5, I-34149 Trieste, Italy
Patrick Zeller
Affiliation:
Elettra Sincrotrone Trieste SCpA, SS14, Km163-5, I-34149 Trieste, Italy
Luca Gregoratti
Affiliation:
Elettra Sincrotrone Trieste SCpA, SS14, Km163-5, I-34149 Trieste, Italy
Andrei Kolmakov*
Affiliation:
Center for Nanoscale Science and Technology, National Institute of Standards and Technology, Gaithersburg, Maryland 20899, United States
*
*Corresponding author: christopher.arble@nist.gov and andrei.kolmakov@nist.gov
*Corresponding author: christopher.arble@nist.gov and andrei.kolmakov@nist.gov

Abstract

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Type
Microscopy and Microanalysis for Real-World Problem Solving
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 730 - 731
Copyright
Copyright © Microscopy Society of America 2019 

References

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