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Reconstruction Metrics in Atom Probe Tomography

Published online by Cambridge University Press:  05 August 2019

BP Geiser
Affiliation:
CAMECA Instruments Inc., Madison, WI, USA.
DA Reinhard*
Affiliation:
CAMECA Instruments Inc., Madison, WI, USA.
JH Bunton
Affiliation:
CAMECA Instruments Inc., Madison, WI, USA.
TR Payne
Affiliation:
CAMECA Instruments Inc., Madison, WI, USA.
KP Rice
Affiliation:
CAMECA Instruments Inc., Madison, WI, USA.
Y Chen
Affiliation:
CAMECA Instruments Inc., Madison, WI, USA.
DJ Larson
Affiliation:
CAMECA Instruments Inc., Madison, WI, USA.
*
*Corresponding author: david.reinhard@ametek.com

Abstract

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Type
Recent Developments in Atom Probe Tomography
Copyright
Copyright © Microscopy Society of America 2019 

References

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