Hostname: page-component-848d4c4894-pftt2 Total loading time: 0 Render date: 2024-05-18T01:10:38.684Z Has data issue: false hasContentIssue false
  • English
  • Français

Resolving Multilayer Structure of Pressure Sensitive Adhesive by Atomic Force Microscopy (AFM)

Published online by Cambridge University Press:  01 August 2018

Hu Duan  and
Shuang Qin
Hu Duan
Affiliation:
Materials Science and Characterization, Avery Dennison Corporation, Mentor, OH44060, USA
Shuang Qin
Affiliation:
Materials Science and Characterization, Avery Dennison Corporation, Mentor, OH44060, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1078 - 1079
Copyright
© Microscopy Society of America 2018 

References

[1] Xie, L., et al, US patent 6(503,620 B1 2003.Google Scholar
[2] Ercillo, J, et al, US patent 5(827), 609 1998.Google Scholar
[3] Sasaki, Y, et al, US patent 5(558), 913 1996.Google Scholar
[4] Xu, G, et al, J. Phys. Chem. B 113 2009 p10189–10195.Google Scholar
[5] Lei, CH, et al, Journal of Colloid and Interface Science 307 2007 p56–63.Google Scholar