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Revealing Embedded Crystals through their Diffracting Signals in Transmission Electron Microscopy

Published online by Cambridge University Press:  05 August 2019

E.F. Rauch  and
M. Véron
E.F. Rauch*
Affiliation:
Univ. Grenoble Alpes, CNRS, Grenoble INP, SIMAP, 38000 Grenoble, France
M. Véron
Affiliation:
Univ. Grenoble Alpes, CNRS, Grenoble INP, SIMAP, 38000 Grenoble, France
*
*Corresponding author: edgar.rauch@simap.grenoble-inp.fr

Abstract

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Type
Electron Crystallography of Nano-structures in Nanotechnology, Materials and Bio-Sciences
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 1922 - 1923
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Rauch, E. F. and Véron, M., “Virtual dark-field images reconstructed from electron diffraction patterns,” Eur. Phys. J. Appl. Phys., vol. 66, no. 1, (2014) p. 10701,.Google Scholar
[2]Valery, A., Rauch, E. F., Clément, L., and Lorut, F., “Retrieving overlapping crystals information from TEM nano-beam electron diffraction patterns,” J. Microsc., vol. 268, no. 2, (2017)Google Scholar