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Robust Deep-learning Based Autofocus Score Prediction for Scanning Electron Microscope

Published online by Cambridge University Press:  30 July 2020

Hyun Jong Yang ,
Moohyun Oh ,
Jonggyu Jang ,
Hyeonsu Lyu  and
Junhee Lee
Hyun Jong Yang
Affiliation:
EgoVid Inc., Ulsan, Ulsan-gwangyoksi, Republic of Korea Coxem, Daejeon, Taejon-jikhalsi, Republic of Korea
Moohyun Oh
Affiliation:
EgoVid Inc., Ulsan, Ulsan-gwangyoksi, Republic of Korea
Jonggyu Jang
Affiliation:
Coxem, Daejeon, Taejon-jikhalsi, Republic of Korea
Hyeonsu Lyu
Affiliation:
Coxem, Daejeon, Taejon-jikhalsi, Republic of Korea
Junhee Lee
Affiliation:
Ulsan National Institute of Science and Technology, Ulsan, Ulsan-gwangyoksi, Republic of Korea

Abstract

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Type
Advances in Modeling, Simulation, and Artificial Intelligence in Microscopy and Microanalysis for Physical and Biological Systems
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 702 - 705
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Copyright
Copyright © Microscopy Society of America 2020

References

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