Hostname: page-component-848d4c4894-ttngx Total loading time: 0 Render date: 2024-05-15T06:07:09.243Z Has data issue: false hasContentIssue false
  • English
  • Français

Role of Electron Illumination on the Image Resolution and Sensitivity of Catalysts Immersed in Gas Environments

Published online by Cambridge University Press:  01 August 2018

S. P. Jespersen ,
M. Ek ,
J. R. Jinschek ,
B. Hendriksen ,
L. Mele ,
P. Dona ,
C. D. Damsgaard  and
S. Helveg
S. P. Jespersen
Affiliation:
Haldor Topsoe A/S, Lyngby, Denmark Department of Physics and Center for Electron Microscopy, Technical University of Denmark, Lyngby, Denmark
M. Ek
Affiliation:
Haldor Topsoe A/S, Lyngby, Denmark Centre for Analysis and Synthesis, Lund University, Lund, Sweden
J. R. Jinschek
Affiliation:
Department of Material Science and Engineering, Ohio State University, USA
B. Hendriksen
Affiliation:
Thermo Fisher Scientific, Eindhoven, The Netherlands
L. Mele
Affiliation:
Thermo Fisher Scientific, Eindhoven, The Netherlands
P. Dona
Affiliation:
Thermo Fisher Scientific, Eindhoven, The Netherlands
C. D. Damsgaard
Affiliation:
Department of Physics and Center for Electron Microscopy, Technical University of Denmark, Lyngby, Denmark
S. Helveg
Affiliation:
Haldor Topsoe A/S, Lyngby, Denmark

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1982 - 1983
Copyright
© Microscopy Society of America 2018 

References

[1] Helveg, S. J. Catal. 328 2015) p. 102.Google Scholar
[2] Jinschek, J. R. Helveg, S. Micron 43 2012) p. 1156.Google Scholar
[3] Helveg, S., et al, Micron 68 2014) p. 176.Google Scholar
[4] Ek, M., et al, Advanced Structural and Chemical Imaging 2 2017) p. 4.Google Scholar
[5] Creemer, J. F., et al, Ultramicroscopy 108 2008) p 993.Google Scholar
[6] Vendelbo, S.B., et al, Nature Materials 13 2014) p. 884.Google Scholar