Hostname: page-component-76fb5796d-5g6vh Total loading time: 0 Render date: 2024-04-26T15:59:02.667Z Has data issue: false hasContentIssue false
  • English
  • Français

SE and BSE Information from CNT Containing Fe at Various Accelerating Voltages

Published online by Cambridge University Press:  01 August 2004

Shuichi Takeuchi ,
Atsushi Muto ,
Mine Nakagawa ,
Sara White ,
Ryuichiro Tamochi ,
Mitsugu Sato ,
Mitsuhiko Yamada  and
David C Joy
Shuichi Takeuchi
Affiliation:
Hitachi Science Systems, Japan
Atsushi Muto
Affiliation:
Hitachi Science Systems, Japan
Mine Nakagawa
Affiliation:
Hitachi Science Systems, Japan
Sara White
Affiliation:
Hitachi High-Technologies America, Gaithersburg, Maryland
Ryuichiro Tamochi
Affiliation:
Hitachi Science Systems, Japan
Mitsugu Sato
Affiliation:
Hitachi High-Technologies Corp., Japan
Mitsuhiko Yamada
Affiliation:
Hitachi Science Systems, Japan
David C Joy
Affiliation:
University of Tennessee, Knoxville and Oak Ridge National Laboratory, Tennessee
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, August 1–5, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S02 , August 2004 , pp. 950 - 951
Copyright
© 2004 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)