Hostname: page-component-848d4c4894-x5gtn Total loading time: 0 Render date: 2024-05-20T00:06:05.497Z Has data issue: false hasContentIssue false
  • English
  • Français

Secondary Electron Imaging in the Helium Ion Microscope

Published online by Cambridge University Press:  27 August 2014

Brad Matola  and
David C Joy
Brad Matola
Affiliation:
Denison University, Granville, OH 43023
David C Joy
Affiliation:
University of Tennessee, Knoxville, TN 37933

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1100 - 1101
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] The authors thank Dr. John Notte of Zeiss, and Dr. Adam Rondinone of the Center for NanoPhase Materials Science at Oak Ridge National Laboratory, for helpful discussions.Google Scholar