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Separation of Bulk and Surface-losses in Low-loss EELS Measurements in STEM

Published online by Cambridge University Press:  31 July 2006

KA Mkhoyan ,
T Babinec ,
SE Maccagnano ,
EJ Kirkland  and
J Silcox
KA Mkhoyan
Affiliation:
Cornell University
T Babinec
Affiliation:
Cornell University
SE Maccagnano
Affiliation:
Cornell University
EJ Kirkland
Affiliation:
Cornell University
J Silcox
Affiliation:
Cornell University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1162 - 1163
Copyright
© 2006 Microscopy Society of America