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Simple Method to Determine the Rotation Between a TEM Image and Diffraction Pattern

Published online by Cambridge University Press:  22 July 2022

Alexana Roshko ,
George Burton  and
Roy Geiss
Alexana Roshko*
Affiliation:
Applied Physics Division, National Institute of Standards and Technology, Boulder, CO, USA
George Burton
Affiliation:
Applied Physics Division, National Institute of Standards and Technology, Boulder, CO, USA
Roy Geiss
Affiliation:
Chemistry Department, Colorado State University, Fort Collins, CO, USA
*
*Corresponding author: roshko@nist.gov

Abstract

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Type
Science of Metrology with Electrons
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 782 - 783
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Copyright
Copyright © Microscopy Society of America 2022

References

Edington, J.W., “1 The Operation and Calibration of the Electron Microscope (Philips Technical Library)”, (The MacMillan Press, London, U.K., 1974) pp. 23–24.CrossRefGoogle Scholar
De Graef, M., “Introduction to Conventional Transmission Electron Microscopy”, Cambridge Solid State Science Series (Cambridge University Press, Cambridge, U.K., 2003); pp. 273–275.CrossRefGoogle Scholar
Williams, D.B. and Carter, C.B., “Transmission Electron Microscopy Part 1: Basics”, (Springer Science1 Business Media, New York, New York, 2009); pp. 167–168.Google Scholar
Contribution of the US Government, not subject to copyright.Google Scholar