Hostname: page-component-848d4c4894-2pzkn Total loading time: 0 Render date: 2024-05-20T23:14:39.368Z Has data issue: false hasContentIssue false

Some Chicago Aberrations

Published online by Cambridge University Press:  01 August 2004

A.V. Crewe
Affiliation:
The Enrico Fermi Institute and Department of Physics, University of Chicago, Chicago, IL 60637, USA
Get access

Abstract

This article presents my reminiscences of the work in Chicago on the correction or reduction of lens aberrations. Studies began in the early 1960s and extended over a period of almost 40 years, although it was never the primary focus of the work of the laboratory. The account is almost entirely based on my own memory, which is not a very reliable instrument. It is not intended to be a review and is more accurately describable as a personal recollection.

Type
Instrumentation and Techniques
Copyright
© 2004 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

Beck, V. (1977). Aberration correction in the STEM. Optik 53, 241.Google Scholar
Beck, V. & Crewe, A.V. (1974). A Quadrupole–Octupole Corrector for a 100 KeV STEM. Proc. 32nd Ann. EMSA Meeting, St. Louis, MO, Arceneaux, C.J. & Bailey, G.W. (Eds.), pp. 426427. Baton Rouge, LA: Claitor's Publishing Division.
Chen, E.G. & Mu, C.J. (1990). New Development in Correction of Spherical Aberration of Electro-Magnetic Round Lens. Int. Symp. Electron Microscopy, Beijing, China, Kuo, K. & Yao, J. (Eds.) pp. 2835. Singapore: World Scientific.
Crewe, A.V. (1980). The sextupole as corrector. Electron Microsc 1, 3637.Google Scholar
Crewe, A.V. (1982). A system for the correction of axial aperture aberrations in electron lenses. Optik 60, 271281.Google Scholar
Crewe, A.V. (1992a). Electron motion in tuned fields, I. The algebra. Ultramicroscopy 41, 269277.Google Scholar
Crewe, A.V. (1992b). Electron motion in tuned fields, II. Some applications. Ultramicroscopy 41, 279285.Google Scholar
Crewe, A.V., Cohen, D., & Meads, P. (1968). A Multipole Element for the Correction of Spherical Aberration. Fourth European Conference on Electron Microscopy, Rome, Bocciarelli, D.S. (Ed.), p. 183. Rome, Italy: Tipografia Poliglotta Vaticana.
Crewe, A.V. & Jiye, X. (1985). Correction of spherical and coma aberrations with a sextupole–round lens–sextupole system. Optik 69, 141146.Google Scholar
Crewe, A.V. & Kopf, D.A. (1980a). Limitations of sextupole correctors. Optik 56, 391399.Google Scholar
Crewe, A.V. & Kopf, K. (1980b). A sextupole system for the correction of spherical aberration. Optik 55, 110.Google Scholar
Crewe, A.V. & Parker, N.W. (1976). Correction of third order aberrations in the scanning electron microscope. Optik 46, 183194.Google Scholar
Crewe, A.V., Ruan, S., Korda, P., & Tsai, F. (2000). Studies of a magnetically focused electrostatic mirror, I. Experimental test of first order properties. J Microsc 197, 110117.Google Scholar
Crewe, A.V. & Salzman, D.A. (1982). On the optimum resolution of a corrected STEM. Ultramicroscopy 9, 373378.Google Scholar
Deltrap, J.H.M. (1964). Correction of Spherical Aberration of Electron Lenses. Cambridge: Cambridge University Press.
El-Kareh, A.B. & El-Kareh, J.C.J. (1970). Electron Beams, Lenses, and Optics. New York: Academic Press.
Haine, M.E. (1961). The Electron Microscope, The Present State of the Art. New York: Interscience.
Hawkes, P.W. (1965). The geometrical aberrations of general electron optical systems. Phil Trans R Soc A 257, 479552.Google Scholar
Jiye, X., Shao, Z., & Crewe, A.V. (1985). The wave electron optical properties of a magnetic round lens corrected with sextupoles. Optik 70, 3742.Google Scholar
Koops, H. (1978). Erprobung eines chromatisch korrigierten elektronenmikroskopischen Objektives. Optik 52, 118.Google Scholar
Parker, N.W., Golladay, S.D., & Crewe, A.V. (1976). A Theoretical analysis of third-order aberration correction in the SEM and STEM. Proc. Scanning Electron Microscope Symposium, IIT Research Institute, pp. 2425.
Scherzer, O. (1936). Some defects of electron lenses. Z Physik 101, 593603.Google Scholar
Scherzer, O. (1947). Spherische und chromatische Korrekvon Elektronen-Linsen. Optik 2, 114132.Google Scholar
Scherzer, O. (1978). Limitations for the resolving power of electron microscopes. Proc. 9th Int. Conf. Electron Microscopy, Toronto, Canada, Sturgess, J.M. (Ed.), pp. 123129. Mississauga, Ontario: The Imperial Press Ltd.
Septier, A. (1966). The Struggle to overcome spherical aberration in electron optics. Adv Optical Electron Microsc 1, 204.Google Scholar
Shao, Z. & Crewe, A.V. (1987). Spherical aberrations of multipoles. J Appl Phys 62, 11491153.Google Scholar
Tsai, F. (2000). Studies of a magnetically focused electrostatic mirror, II. Aberration correction. J Microsc 197, 118135.Google Scholar
Zworykin, V.K., Mortin, G.A., Ramberg, E.G., Hillier, J., & Bamve, E.E. (1945). Electron Optics and the Electron Microscope. New York: John Wiley & Sons.