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Spatially Resolved Characterization of Interface Plasmons in Si/SiO2 Core/Shell Nanostructures

Published online by Cambridge University Press:  26 July 2009

J Wang
Affiliation:
The Chinese University of Hong Kong
X Wang
Affiliation:
The Chinese University of Hong Kong
Y Jiao
Affiliation:
The Chinese University of Hong Kong
Q Li
Affiliation:
The Chinese University of Hong Kong
M-W Chu
Affiliation:
National Taiwan University,Taiwan
M Malac
Affiliation:
National Institute for Nanotechnology,Canada

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2009