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SRM 482: Revisited After 30 Years

Published online by Cambridge University Press:  02 July 2020

Eric Windsor ,
Robert Carlton ,
Scott Wightal  and
Charles Lyman
Eric Windsor
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD, 20899
Robert Carlton
Affiliation:
Elan Pharmaceuticals, King of Prussia, PA, 19406
Scott Wightal
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD, 20899
Charles Lyman
Affiliation:
Lehigh University, Dept of Materials Science and Engineering, Bethlehem, PA, 18015
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Abstract

The National Institute of Standards and Technology’s (NIST) Standard Reference Material (SRM) 482 was issued by The National Bureau of Standards (NBS) in 1969 i has been continuously available to the public for over 30 years [1]. The standard cons of a set of 6 wires. Each wire is approximately 0.5 mm in diameter and 5 cm long. Tl wires represent different compositions within the binary copper-gold alloy system. Included in the set are the two end member compositions, pure copper and pure gold, along with 4 alloys of nominal composition: Au80-Cu20, Au60-Cu40, Au40-Cu60 an< Au20-Cu80. SRM 482 was produced specifically for the purpose of microanalysis usi the electron probe microanalyzer (EPMA).

Recent metallographic preparation of these wires revealed the presence of surface blemishes on some of the prepared wires (Figure la). Two of the authors from differei affiliations recently prepared cross-sections of SRM wires from separately purchased sets. Each was unaware of the procedures used by the other.

Type
Quantitative X-Ray Microanalysis in the Microprobe, in the SEM and in The ESEM:Theory and Practice (Organized by R. Gauvin and E. Lifshin)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 678 - 679
Copyright
Copyright © Microscopy Society of America 2001

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References

1. Certificate of Analysis: Standard Reference Material 482 (1969).Google Scholar

2. Heinrich, K. F. J.: Adv. in X-ray Analysis 11 (Plenum Press, New York, 1968) p. 40.CrossRefGoogle Scholar

3. Heinrich, K. F. J., et al.: NBS Special Publication 260-28 (1971).Google Scholar

4. Metallography and Microstructures: ASM Handbook, vol. 9 (1985). p. 399–414.Google Scholar