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Standard Bundles Simplify Standards-based Quantification in NIST DTSA-II

Published online by Cambridge University Press:  04 August 2017

Nicholas W. M. Ritchie ,
Michael J. Mengason  and
Dale E. Newbury
Nicholas W. M. Ritchie
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899-8371
Michael J. Mengason
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899-8371
Dale E. Newbury
Affiliation:
National Institute of Standards and Technology, Gaithersburg, MD 20899-8371

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 220 - 221
Copyright
© Microscopy Society of America 2017 

References

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[3] Reed, S. J. B. Electron Microprobe Analysis and Scanning Electron Microscopy in Geology. Cambridge University Press 2nd. edition July 2005.Google Scholar
[4] Newbury, Dale E. & Ritchie, Nicholas W. M. Journal of Materials Science 50(2 2015). p 493.CrossRefGoogle Scholar