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Statistical Analysis Of SEM-EDX Spectrum Images Of A Metal-Ceramic Braze

Published online by Cambridge University Press:  02 July 2020

P.G. Kotula
Affiliation:
Materials and Process Sciences Center, Sandia National Laboratories, Albuquerque, NM87185-1405
I.M. Anderson
Affiliation:
Oak Ridge National Laboratory, MS-6376, PO Box 2008, Oak Ridge, TN37831-6376
J.J. Stephens
Affiliation:
Materials and Process Sciences Center, Sandia National Laboratories, Albuquerque, NM87185-1405
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Extract

Spectrum imaging, where a complete spectrum is acquired at each pixel in an image, is potentially a very powerful technique for the characterization of materials. The primary challenge to overcome is to extract all of the relevant information from what are typically large data sets that cannot be readily visualized in their entirety. For energy-dispersive X-ray (EDX) spectrum images, simple mapping has typically been done. In this work, the application of multivariate statistical analysis (MSA) to the characterization of a metal/alumina braze by SEM-EDX spectrum images is described.

The braze characterized in this work joins polycrystalline alumina and a copper-silver eutectic alloy containing some titanium (an ‘active’ metal). The specimen geometry consisted of a sandwich of two pieces of alumina, two braze layers and a Kovar (primarily Fe, Ni and Co) filler layer in the middle. The entire assembly was heat-treated to bond the interfaces and then a polished cross-section was prepared.

Type
Future of Microscopy: Ceramics, Composites, and Cement
Copyright
Copyright © Microscopy Society of America

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References

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4. Sandia is a multi-program laboratory operated by Sandia Corporation, a Lockheed Martin Company, for the United States Department of Energy (DOE) under contract DE-AC04-94AL85000.Research at the ORNL SHaRE User Facility sponsored by the Division of Materials Sciences, U.S. DOE, under contract DE-AC05-96OR22464 with Lockheed Martin Energy Research CorporationGoogle Scholar