Hostname: page-component-848d4c4894-4hhp2 Total loading time: 0 Render date: 2024-05-16T02:51:52.987Z Has data issue: false hasContentIssue false
  • English
  • Français

Sub-Ångstrom Metrology of Resolution in Aberration-Corrected Transmission Electron Microscopes using the A-OK Standard Test Specimens

Published online by Cambridge University Press:  01 August 2004

Lawrence F. Allard  and
Michael A. O'Keefe
Lawrence F. Allard
Affiliation:
ORNL, Oak Ridge, Tennessee
Michael A. O'Keefe
Affiliation:
LBNL, Berkeley, California
Get access

Extract

Extended abstract of a paper presented at the Pre-Meeting Congress: Materials Research in an Aberration-Free Environment, at Microscopy and Microanalysis 2004 in Savannah, Georgia, USA, July 31 and August 1, 2004.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 10 , Issue S03 , August 2004 , pp. 66 - 67
Copyright
© 2004 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)