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Sub-Ångstrom Resolution through Aberration-Corrected STEM

Published online by Cambridge University Press:  24 July 2003

S. J. Pennycook ,
A. R. Lupini ,
M. Varela ,
A. Borisevich ,
Y. Peng ,
M. F. Chisholm ,
N. Dellby ,
O. L. Krivanek ,
P. D. Nellist  and
S. Z. Szilagyi
...Show all authors
S. J. Pennycook
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN
A. R. Lupini
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN
M. Varela
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN
A. Borisevich
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN
Y. Peng
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN
M. F. Chisholm
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN
N. Dellby
Affiliation:
Nion Co., 1102 8th St., Kirkland, WA
O. L. Krivanek
Affiliation:
Nion Co., 1102 8th St., Kirkland, WA
P. D. Nellist
Affiliation:
Nion Co., 1102 8th St., Kirkland, WA
S. Z. Szilagyi
Affiliation:
Nion Co., 1102 8th St., Kirkland, WA
G. Duscher
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN Department of Materials Science and Engineering, North Carolina State University, Raleigh, NC

Abstract

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Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 926 - 927
Copyright
Copyright © Microscopy Society of America 2003