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The superSTEM: An Aberration Corrected Analytical Microscopy Facility

Published online by Cambridge University Press:  01 August 2002

A. Bleloch ,
L.M. Brown ,
R. Brydson ,
A. Craven ,
P. Goodhew  and
C. Keily
A. Bleloch
Affiliation:
University of Cambridge, Cavendish Laboratory, Madingley Rd., Cambridge CB3 0HE, UK
L.M. Brown
Affiliation:
University of Cambridge, Cavendish Laboratory, Madingley Rd., Cambridge CB3 0HE, UK
R. Brydson
Affiliation:
Materials, University of Leeds, Leeds, LS2 9JT, UK
A. Craven
Affiliation:
Physics and Astronomy, The Kelvin Building, University of Glasgow, Glasgow, G12 8QQ, UK
P. Goodhew
Affiliation:
Materials Science and Engineering, University of Liverpool, Liverpool L69 3GH, UK
C. Keily
Affiliation:
Materials Science and Engineering, University of Liverpool, Liverpool L69 3GH, UK

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 470 - 471
Copyright
Copyright © Microscopy Society of America 2002