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TEM and FESEM: The Right Combination for Enhanced Particle Characterization

  • KL Bunker (a1), D McAllister (a1), KA Allison (a1), K Wagner (a1), K Rickabaugh (a1), AM Levine (a1), BR Strohmeier (a1) and RJ Lee (a1)...
Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

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Microscopy and Microanalysis
  • ISSN: 1431-9276
  • EISSN: 1435-8115
  • URL: /core/journals/microscopy-and-microanalysis
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