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TEM and SEM Investigation on Oxidised Ge-based Clathrates

Published online by Cambridge University Press:  03 August 2008

C Hébert ,
B Bartova ,
M Cantoni ,
U Aydemir  and
M Baitinger
C Hébert
Affiliation:
Ecole Polytecnique Fédérale, Switzerland
B Bartova
Affiliation:
Ecole Polytecnique Fédérale, Switzerland
M Cantoni
Affiliation:
Ecole Polytecnique Fédérale, Switzerland
U Aydemir
Affiliation:
Max Planck Institute for Chemical Physics of Solids, Germany
M Baitinger
Affiliation:
Max Planck Institute for Chemical Physics of Solids, Germany
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1142 - 1143
Copyright
© 2008 Microscopy Society of America

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