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TEM Sample Preparation of Buried Interfaces in Porous Layered Materials

Published online by Cambridge University Press:  30 July 2021

Warren L. York ,
Dong Ding ,
Hanping Ding  and
Joshua D. Sugar
Warren L. York*
Affiliation:
Sandia National Laboratories, Livermore, California, United States
Dong Ding
Affiliation:
Idaho National Laboratory, Idaho Falls, Idaho, United States
Hanping Ding
Affiliation:
Idaho National Laboratory, Idaho Falls, Idaho, United States
Joshua D. Sugar
Affiliation:
Sandia National Laboratories, Livermore, California, United States
*
*Corresponding author: wlyork@sandia.gov

Abstract

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Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 3466 - 3467
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Giannuzzi, L.A. and Stevie, F.A., Micron volume 30 issue 3 (1999), p. 197-204.Google Scholar
Denisyuk, Andrey, Hrncir, Tomas, Sharang, Fozef Obona, Petrenec, Martin and Michalicka, Jan, Microscopy and Microanalysis Volume 23 Issue 3 (2017) p. 484 - 490CrossRefGoogle Scholar
Sandia National Laboratories is a multimission laboratory managed and operated by National Technology and Engineering Solutions of Sandia LLC, a wholly owned subsidiary of Honeywell International Inc., for the U.S. Department of Energy's National Nuclear Security Administration under contract DE-NA0003525. This paper describes objective technical results and analysis. Any subjective views or opinions that might be expressed in the paper do not necessarily represent the views of the U.S. Department of Energy or the United States Government.Google Scholar