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Temperature Dependence of Fracture Initiation in Silicon fromIn-situSEM

Published online by Cambridge University Press:  25 July 2016

Eric Hintsala ,
Sanjit Bhowmick ,
Xie Yueyue ,
Roberto Ballarini  and
William Gerberich
Eric Hintsala
Affiliation:
Hysitron, Inc., Eden Prarie MN, USA
Sanjit Bhowmick
Affiliation:
Hysitron, Inc., Eden Prarie MN, USA
Xie Yueyue
Affiliation:
University of Houston, Department of Civil Engineering, HoustonTX, USA
Roberto Ballarini
Affiliation:
University of Houston, Department of Civil Engineering, HoustonTX, USA
William Gerberich
Affiliation:
University of Minnesota, Department of Chemical Engineering and Materials Science, MinneapolisMN, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1746 - 1747
Copyright
© Microscopy Society of America 2016 

References

References:

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[4] Wagner, A. J., Hintsala, E. D., Kumar, P., Mkhoyan, K. A. & Gerberich, W. W. Acta Mater. 100 (2015) 256–265.CrossRefGoogle Scholar
[5] Hintsala, E. D., Teresi, C. & Gerberich, W. W. Met. Trans. A (submitted.Google Scholar