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Template Matching as a Tool to Analyze Electron Tomograms

Published online by Cambridge University Press:  01 August 2010

R Schoenmakers ,
A Yakushevska  and
M Storms
R Schoenmakers
Affiliation:
FEI Company, The Netherlands
A Yakushevska
Affiliation:
FEI Company, The Netherlands
M Storms
Affiliation:
FEI Company, The Netherlands

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1854 - 1855
Copyright
Copyright © Microscopy Society of America 2010