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TEMTUTOR - a Teaching Multimedia Program for TEM

Published online by Cambridge University Press:  02 July 2020

V.-T. Kuokkala  and
T.K. Lepistö
V.-T. Kuokkala
Affiliation:
Institute of Materials Science, Center for Electron Microscopy, Tampere University of Technology, FIN-33101Tampere, Finland
T.K. Lepistö
Affiliation:
Institute of Materials Science, Center for Electron Microscopy, Tampere University of Technology, FIN-33101Tampere, Finland
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Extract

Teaching of transmission electron microscopy usually includes both lectures on the contrast theories, electron diffraction, etc., and practical hands-on operation of the microscope. The number of students attending the lectures is normally unlimited, but at the microscope, only a few persons can work at the same time. Since the microscopes are expensive, it would be of a great help if cheaper 'training' microscopes with basic imaging and diffraction capabilities were available. These functions, in fact, can quite easily be realized with fast personal computers and work stations, where the simulation of transmission electron micrographs and related diffraction patterns can help the student better understand the image formation processes. Adding text, audio and video help capabilities to the program, it can be made an efficient supplemental teaching tool.

TemTutor for Windows is based on microScope for Windows, which is a BF/DF TEM micrograph simulation program for dislocations and stacking faults.

Type
Computational Methods for Microscopy
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 1161 - 1162
Copyright
Copyright © Microscopy Society of America 1997

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References

1.V.-T., Kuokkala, microScope for Windows - a Simulation Program for Transmission Electron Micrographs, Journal of Computer-Assisted Microscopy Vol. 8, No. 2, pp. 63–74. (1996)Google Scholar
2.V-T., KuokkalaComputer simulation of transmission electron micrographs by microScope for Windows, Proc. Microscopy&Microanalysis 1996, Minneapolis, USA, pp. 126–127.(1996)Google Scholar
3.A.K., Head,P., Humble, L.M., Clarebrough,A.J., Morton, C.T., ForwoodComputed electron micrographs and defect identification. North-Holland Publ. Co., Amsterdam. (1973).Google Scholar