Skip to main content Accessibility help
×
Home
Hostname: page-component-544b6db54f-mdtzd Total loading time: 0.243 Render date: 2021-10-22T01:39:10.989Z Has data issue: true Feature Flags: { "shouldUseShareProductTool": true, "shouldUseHypothesis": true, "isUnsiloEnabled": true, "metricsAbstractViews": false, "figures": true, "newCiteModal": false, "newCitedByModal": true, "newEcommerce": true, "newUsageEvents": true }

Three-dimensional Charge Density and Electric Field Mapping of an Electrically Biased Needle Using Off-axis Electron Holography

Published online by Cambridge University Press:  30 July 2020

Fengshan Zheng
Affiliation:
Forschungszentrum Juelich, Juelich, Nordrhein-Westfalen, Germany
Vadim Migunov
Affiliation:
Forschungszentrum Juelich, Juelich, Nordrhein-Westfalen, Germany
Jan Caron
Affiliation:
Forschungszentrum Juelich, Juelich, Nordrhein-Westfalen, Germany
Hongchu Du
Affiliation:
Forschungszentrum Juelich, Juelich, Nordrhein-Westfalen, Germany
Giulio Pozzi
Affiliation:
Università di Bologna, Bologna, Emilia-Romagna, Italy
Rafal Dunin-Borkowski
Affiliation:
Forschungszentrum Juelich, Juelich, Nordrhein-Westfalen, Germany
Rights & Permissions[Opens in a new window]

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Direct Phase Imaging with Coherent Electron Beam in TEM
Copyright
Copyright © Microscopy Society of America 2020

References

Sze, S.M., Semiconductor devices: physics and technology, Wiley, 2008.Google Scholar
Zhang, H., et al. , Nat. Nanotech. 11 (2016) 273.10.1038/nnano.2015.276CrossRefGoogle Scholar
Vurpillot, F., et al. , Ultramicroscopy. 159 (2015) 202.10.1016/j.ultramic.2014.12.013CrossRefGoogle Scholar
Su, Y., et al. , Nat. Nanotech. 11 (2016) 609.10.1038/nnano.2016.30CrossRefGoogle Scholar
Lichte, H., et al. , Rep. Prog. Phys. 71 (2007) 016102.10.1088/0034-4885/71/1/016102CrossRefGoogle Scholar
Zheng, F., et al. , J. Elec. Spec. Rel. Phenom. 2020, in press.Google Scholar
The authors acknowledge the European Union for funding through the Marie Curie Initial Training Network Grant No. 606988 under FP7-PEOPLE-2013-ITN).Google Scholar
You have Access

Send article to Kindle

To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle. Find out more about sending to your Kindle.

Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Three-dimensional Charge Density and Electric Field Mapping of an Electrically Biased Needle Using Off-axis Electron Holography
Available formats
×

Send article to Dropbox

To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Dropbox.

Three-dimensional Charge Density and Electric Field Mapping of an Electrically Biased Needle Using Off-axis Electron Holography
Available formats
×

Send article to Google Drive

To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Google Drive.

Three-dimensional Charge Density and Electric Field Mapping of an Electrically Biased Needle Using Off-axis Electron Holography
Available formats
×
×

Reply to: Submit a response

Please enter your response.

Your details

Please enter a valid email address.

Conflicting interests

Do you have any conflicting interests? *