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The time-of-flight (ToF) analysis of transmitted electrons at energies of hundred of eV for pure elements

Published online by Cambridge University Press:  30 July 2021

Ivo Konvalina
Affiliation:
Institute of Scientific Instruments of the CAS, v. v. i., Brno, Jihomoravsky kraj, Czech Republic
Martin Zouhar
Affiliation:
Institute of Scientific Instruments of the CAS, v. v. i., Brno, Jihomoravsky kraj, Czech Republic
Benjamin Daniel
Affiliation:
Institute of Scientific Instruments of the CAS, v. v. i., Brno, Jihomoravsky kraj, Czech Republic
Aleš Paták
Affiliation:
Institute of Scientific Instruments of the CAS, v. v. i., Brno, Jihomoravsky kraj, Czech Republic
Jakub Piňos
Affiliation:
Institute of Scientific Instruments of the CAS, v. v. i., Brno, Jihomoravsky kraj, Czech Republic
Luděk Frank
Affiliation:
Institute of Scientific Instruments of the CAS, v. v. i., Brno, Jihomoravsky kraj, Czech Republic
Ilona Müllerová
Affiliation:
Institute of Scientific Instruments of the Czech Academy of Sciences, Brno, Czech Republic
Eliška Materna Mikmeková
Affiliation:
Institute of Scientific Instruments of the Czech Academy of Sciences, Brno, Czech Republic

Abstract

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Type
Advanced Imaging and Spectroscopy for Nanoscale Materials Characterization
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

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The authors acknowledge funding from the Technology Agency of the Czech Republic (Centre of Electron and Photonic Optics, no. TN01000008).Google Scholar