Hostname: page-component-848d4c4894-x24gv Total loading time: 0 Render date: 2024-05-15T16:33:49.918Z Has data issue: false hasContentIssue false
  • English
  • Français

Tomographic Imaging with Single Atom Sensitivity Using Aberration-Corrected STEM

Published online by Cambridge University Press:  01 August 2005

K van Benthem ,
A R Lupini ,
Y Peng  and
S J Pennycook
K van Benthem
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
A R Lupini
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
Y Peng
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
S J Pennycook
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 318 - 319
Copyright
© 2005 Microscopy Society of America