Hostname: page-component-848d4c4894-nr4z6 Total loading time: 0 Render date: 2024-05-02T10:53:37.557Z Has data issue: false hasContentIssue false
  • English
  • Français

Ultimate Resolution Limit for ADF-STEM

Published online by Cambridge University Press:  16 July 2003

Y. Peng ,
S. J. Pennycook  and
P. D. Nellist
Y. Peng
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6030
S. J. Pennycook
Affiliation:
Condensed Matter Sciences Division, Oak Ridge National Laboratory, Oak Ridge, TN 37831-6030
P. D. Nellist
Affiliation:
Nion Co., 1102 8th St., Kirkland, WA 98033, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 940 - 941
Copyright
Copyright © Microscopy Society of America 2003