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Ultra-High Resolution Electron Tomography for Materials Science: a Roadmap

Published online by Cambridge University Press:  08 April 2017

K Batenburg ,
S Bals ,
S Van Aert ,
T Roelandts  and
J Sijbers
K Batenburg
Affiliation:
Centrum Wiskunde & Informatica, The Netherlands
S Bals
Affiliation:
University of Antwerp, Belgium
S Van Aert
Affiliation:
University of Antwerp, Belgium
T Roelandts
Affiliation:
University of Antwerp, Belgium
J Sijbers
Affiliation:
University of Antwerp, Belgium

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 934 - 935
Copyright
Copyright © Microscopy Society of America 2011