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Understanding Atomic-Scale Phenomena in Functional Materials by Using STEM, ELNES, and Theoretical Calculations

Published online by Cambridge University Press:  01 August 2010

T Mizoguchi ,
T Tohei ,
Y Sato ,
T Yamamoto ,
Y Ikuhara ,
H Ohta ,
H Hiramatsu  and
H Hosono
T Mizoguchi
Affiliation:
The University of Tokyo, Japan
T Tohei
Affiliation:
The University of Tokyo, Japan
Y Sato
Affiliation:
The University of Tokyo, Japan
T Yamamoto
Affiliation:
The University of Tokyo, Japan
Y Ikuhara
Affiliation:
The University of Tokyo, Japan
H Ohta
Affiliation:
Nagoya University, Japan
H Hiramatsu
Affiliation:
Tokyo Institute of Technology, Japan
H Hosono
Affiliation:
Tokyo Institute of Technology, Japan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 84 - 85
Copyright
Copyright © Microscopy Society of America 2010