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Uranium Single Atom Imaging And EELS Mapping using Aberration Corrected Scanning Transmission Electron Microscope and LN2 Cold Stage

Published online by Cambridge University Press:  03 August 2008

H Inada ,
J Wall ,
Y Zhu ,
V Volkov ,
K Nakamura ,
M Konno  and
K Jarausch
H Inada
Affiliation:
Hitachi High Technologies America
J Wall
Affiliation:
Brookhaven National Laboratory
Y Zhu
Affiliation:
Brookhaven National Laboratory
V Volkov
Affiliation:
Brookhaven National Laboratory
K Nakamura
Affiliation:
Hitachi High Technologies Corp
M Konno
Affiliation:
Hitachi High Technologies Corp
K Jarausch
Affiliation:
Hitachi High Technologies America
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2008 in Albuquerque, New Mexico, USA, August 3 – August 7, 2008

Type
Research Article
Information
Microscopy and Microanalysis , Volume 14 , Supplement S2 , August 2008 , pp. 1386 - 1387
Copyright
© 2008 Microscopy Society of America

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