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Use of Ferroelectric Single-crystal Bimorphs for Precise Positioning in Scanning Probe Microscope

Published online by Cambridge University Press:  30 July 2020

Ilya Kubasov
Affiliation:
National University of Science and Technology MISiS, Moscow, Moskva, Russia
Aleksandr Kislyuk
Affiliation:
National University of Science and Technology MISiS, Moscow, Moskva, Russia
Andrei Turutin
Affiliation:
National University of Science and Technology MISiS, Moscow, Moskva, Russia
Aleksandr Temirov
Affiliation:
National University of Science and Technology MISiS, Moscow, Moskva, Russia
Sergey Ksenich
Affiliation:
National University of Science and Technology MISiS, Moscow, Moskva, Russia
Mikhail Malinkovich
Affiliation:
National University of Science and Technology MISiS, Moscow, Moskva, Russia
Yuriy Parkhomenko
Affiliation:
National University of Science and Technology MISiS, Moscow, Moskva, Russia

Abstract

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Type
Surface and Subsurface Microscopy and Microanalysis of Physical and Biological Specimens - Complimentary Microwave Interrogation in Surface Analysis
Copyright
Copyright © Microscopy Society of America 2020

References

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