Hostname: page-component-848d4c4894-hfldf Total loading time: 0 Render date: 2024-05-10T04:41:41.696Z Has data issue: false hasContentIssue false
  • English
  • Français

Uses of a STEM Cs-Corrector in Electron Diffractive Imaging

Published online by Cambridge University Press:  05 August 2007

C Dwyer ,
P Hartel ,
H Muller ,
M Haider  and
AI Kirkland
C Dwyer
Affiliation:
Univeristy of Oxford,UK
P Hartel
Affiliation:
CEOS GmbH,Germany
H Muller
Affiliation:
CEOS GmbH,Germany
M Haider
Affiliation:
CEOS GmbH,Germany
AI Kirkland
Affiliation:
Univeristy of Oxford,UK
Get access

Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2007 in Ft. Lauderdale, Florida, USA, August 5 – August 9, 2007

Type
Research Article
Information
Microscopy and Microanalysis , Volume 13 , Issue S02 , August 2007 , pp. 958 - 959
Copyright
© 2007 Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)