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Using 4D-STEM to Track Structural Changes Due to Electrochemical Doping in Organic Electrochemical Transistors

Published online by Cambridge University Press:  22 July 2022

Andrew A. Herzing ,
Lucas Q. Flagg ,
Lee J. Richter ,
Jonathan W. Onorato  and
Christine K. Luscombe
Andrew A. Herzing*
Affiliation:
Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA
Lucas Q. Flagg
Affiliation:
Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA
Lee J. Richter
Affiliation:
Material Measurement Laboratory, National Institute of Standards and Technology, Gaithersburg, MD, USA
Jonathan W. Onorato
Affiliation:
Department of Materials Science and Engineering, University of Washington, Seattle, WA, USA
Christine K. Luscombe
Affiliation:
Department of Materials Science and Engineering, University of Washington, Seattle, WA, USA
*
*Corresponding author: andrew.herzing@nist.gov

Abstract

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Type
On Demand - Electron Microscopy of Beam Sensitive Samples: The Trials and Tribulations of Electron-Beam Sample Interactions
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 2256 - 2257
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Copyright
Copyright © Microscopy Society of America 2022

References

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Flagg, L. Q., et al. J Am Chem Soc 141 (2019) 4345. doi: 10.1021/jacs.8b12640CrossRefGoogle Scholar
Herzing, A. A., et al. Microsc Microanal 27S1 (2021) 1792. doi: 10.1017/s1431927621006553Google Scholar
Dong, B. X., et al. Chem Mater 31 (2019) 1418. doi: 10.1021/acs.chemmater.8b05257Google Scholar