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Using a Moderate Vacuum, Hot/Cryo-Stage Equipped AFM for In-Situ Observation of α-Phase Growth In 60SN40PB Hypoeutectic Solder

Published online by Cambridge University Press:  02 July 2020

D. N. Leonard
Affiliation:
Dept.of Material Science and Engineering, Box 7531, North Carolina State University, Raleigh, NC 27695-7531
P.E. Russell
Affiliation:
Dept.of Material Science and Engineering, Box 7531, North Carolina State University, Raleigh, NC 27695-7531
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Extract

Atomic force microscopy (AFM) was introduced in 1984, and proved to be more versatile than scanning tunneling microscopy (STM) due to the AFM's capabilities to scan non-conductive samples under atmospheric conditions and achieve atomic resolution. Ultra high vacuum (UHV) AFM has been used in surface science applications when control of oxidation and corrosion of a sample's surface are required. Expensive equipment and time consuming sample exchanges are two drawbacks of the UHV AFM system that limit its use. Until recently, no hot/cryo-stage, moderate vacuum, controlled gas environment AFM was commonly available.

We have demonstrated that phase transformations are easily observable in metal alloys and polymers with the use of a moderate vacuum AFM that has in-situ heating/cooling capabilities and quick (within minutes) sample exchange times. This talk will describe the results of experiments involving a wide range of samples designed to make use of the full capabilities of a hot/cryo-stage, controlled gas environment AFM.

Type
Scanned Probe Microscopy: Much More Than Just Beautiful Images
Copyright
Copyright © Microscopy Society of America

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References

1.Ottaviano, L., et al., Surface Science, 373 (1997) 318.CrossRefGoogle Scholar
2.Koshiba, S., et al., J. of Crystal Growth, 175/176 (1997) 804.CrossRefGoogle Scholar