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Utilizing Scanning Probe Microscopy to Investigate Preferential Conductive Paths through Polycrystalline BaTiO3Dielectric Layer of MLCCs

Published online by Cambridge University Press:  25 July 2016

Talin Ayvazian ,
Gennadi Bersuker ,
Miles J Brodie ,
Zachary R Lingley  and
Brendan J Foran
Talin Ayvazian
Affiliation:
The Aerospace Corporation, Microelectronics Technology Department, El Segundo, CA, USA
Gennadi Bersuker
Affiliation:
The Aerospace Corporation, Microelectronics Technology Department, El Segundo, CA, USA
Miles J Brodie
Affiliation:
The Aerospace Corporation, Microelectronics Technology Department, El Segundo, CA, USA
Zachary R Lingley
Affiliation:
The Aerospace Corporation, Microelectronics Technology Department, El Segundo, CA, USA
Brendan J Foran
Affiliation:
The Aerospace Corporation, Microelectronics Technology Department, El Segundo, CA, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 390 - 391
Copyright
© Microscopy Society of America 2016 

References

References:

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[2] Gheno, SM, etal, Journal of American Ceramic Society 91 (2008). p. 3593.Google Scholar
[3] Bersuker, G., et al, Solid-State Electronics 65–66 (201)l). p. 146.Google Scholar
[4] Hong, S in Nanoscale Phenomena in Ferroelectric Thin Films. Springer Science & Business Media, New York) p. 219.Google Scholar