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Vibrational STEM-EELS of Single Si Atom Point Defects in Graphene

Published online by Cambridge University Press:  30 July 2020

Fredrik Hage ,
Guillaume Radtke ,
Demie Kepaptsoglou ,
Michele Lazzeri  and
Quentin Ramasse
Fredrik Hage
Affiliation:
SuperSTEM Laboratory and University of Oxford, Daresbury, England, United Kingdom
Guillaume Radtke
Affiliation:
Sorbonne Université - CNRS, Paris, Ile-de-France, France
Demie Kepaptsoglou
Affiliation:
SuperSTEM Laboratory and University of York, Daresbury, England, United Kingdom
Michele Lazzeri
Affiliation:
Sorbonne Université - CNRS, Paris, Ile-de-France, France
Quentin Ramasse
Affiliation:
SuperSTEM Laboratory and University of Leeds, Daresbury, England, United Kingdom

Abstract

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Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 954 - 955
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Copyright
Copyright © Microscopy Society of America 2020

References

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SuperSTEM is the UK National Research Facility for Advanced Electron Microscopy, supported by the Engineering and Physical Sciences Research Council (EPSRC).Google Scholar