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XEDS with SDD-Technology in Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  26 July 2009

M Falke ,
A Mogilatenko ,
H Kirmse ,
W Neumann ,
C Brombacher ,
M Albrecht ,
AL Bleloch ,
G Tränkle ,
A Käppel  and
R Terborg
...Show all authors
M Falke
Affiliation:
Bruker-AXS Microanalysis GmbH,Germany
A Mogilatenko
Affiliation:
Humboldt University zu Berlin,Germany
H Kirmse
Affiliation:
Humboldt University zu Berlin,Germany
W Neumann
Affiliation:
Humboldt University zu Berlin,Germany
C Brombacher
Affiliation:
University of Technology Chemnitz,Germany
M Albrecht
Affiliation:
University of Technology Chemnitz,Germany
AL Bleloch
Affiliation:
University of Liverpool,United Kingdom
G Tränkle
Affiliation:
Ferdinand Braun Institute,Berlin,Germany
A Käppel
Affiliation:
Bruker-AXS Microanalysis GmbH,Germany
R Terborg
Affiliation:
Bruker-AXS Microanalysis GmbH,Germany
R Kroemer
Affiliation:
Bruker-AXS Microanalysis GmbH,Germany
M Rohde
Affiliation:
Bruker-AXS Microanalysis GmbH,Germany

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2009 in Richmond, Virginia, USA, July 26 – July 30, 2009

Type
Abstract
Information
Microscopy and Microanalysis , Volume 15 , Supplement S2 , July 2009 , pp. 202 - 203
Copyright
Copyright © Microscopy Society of America 2009