Hostname: page-component-848d4c4894-nmvwc Total loading time: 0 Render date: 2024-06-16T19:56:25.345Z Has data issue: false hasContentIssue false

XPS and FESEM/STEM Surface Characterization of Activated Carbon, Carbon Black, and Carbon Nanotubes

Published online by Cambridge University Press:  01 August 2010

BR Strohmeier
Affiliation:
RJ Lee Group, Inc
JD Piasecki
Affiliation:
RJ Lee Group, Inc
KL Bunker
Affiliation:
RJ Lee Group, Inc
JL Sturgeon
Affiliation:
RJ Lee Group, Inc
BA Stitch
Affiliation:
RJ Lee Group, Inc
JP Marquis Jr
Affiliation:
RJ Lee Group, Inc

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2010