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Z-contrast imaging as a tool for atomic level analysis of bimetallic structures

Published online by Cambridge University Press:  25 July 2016

M. Cem Akatay
Affiliation:
UOP LLC, A Honeywell Company
Sergio I. Sanchez
Affiliation:
UOP LLC, A Honeywell Company
Steven A. Bradley
Affiliation:
UOP LLC, A Honeywell Company

Abstract

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Type
Abstract
Copyright
© Microscopy Society of America 2016 

References

[1] Krivanek, O.L., et al., Nature 464 (2010) 571574.CrossRefGoogle Scholar
[2] LeBeau, , et al, Ultramicroscopy (2008) 108, 16531658.Google Scholar
[3] Yang, , et al., Materials Characterization (2003) 51, 101107.Google Scholar
[4] Ortalan, , et al., Nature Nanotechnology 5, 843847, 2010.Google Scholar
[5] Browning, , et al., ChemCatChem (2013) 5, 26732683.Google Scholar
[6] Akatay, , et al., Microscopy and Microanalysis (2015) 21(S3), 641642.Google Scholar