Skip to main content
×
Home

Atomic Elemental and Chemical Analysis of SrTiO3/LaMnO3 Multilayers Using Fast Simultaneous EELS and EDS Analysis in DigitalMicrograph

  • Paolo Longo (a1), Paul J Thomas (a1), Aziz Aitouchen (a1), Phil Rice (a2), Teya Topuria (a2) and Ray D Twesten (a1)...
    • Send article to Kindle

      To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle.

      Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

      Find out more about the Kindle Personal Document Service.

      Atomic Elemental and Chemical Analysis of SrTiO3/LaMnO3 Multilayers Using Fast Simultaneous EELS and EDS Analysis in DigitalMicrograph
      Available formats
      ×
      Send article to Dropbox

      To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your Dropbox account. Find out more about sending content to Dropbox.

      Atomic Elemental and Chemical Analysis of SrTiO3/LaMnO3 Multilayers Using Fast Simultaneous EELS and EDS Analysis in DigitalMicrograph
      Available formats
      ×
      Send article to Google Drive

      To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your Google Drive account. Find out more about sending content to Google Drive.

      Atomic Elemental and Chemical Analysis of SrTiO3/LaMnO3 Multilayers Using Fast Simultaneous EELS and EDS Analysis in DigitalMicrograph
      Available formats
      ×
Abstract
Copyright
Corresponding author
*plongo@gatan.com
References
Hide All
[1]Krivaneck OLet al., Ultramicroscopy 96 (2003) 229237.
[2]Pennycook S, Microsc Anal 26(6) (2012) 5964.
[3]Longo Pet al., Microsccopy Today 20(4) (2012) 3036.
[4]Longo Pet al., Microscopy Today 21(4) 2013) 3640.
[5]Schlossmacher Pet al., Microscopy Today 18 (2010) 1420.
[6]Phillips PJet al., Microsc Microanal 20 (2014) 10461052.
[7]IOP Publishing. Nanotechweb.org, “EDX detects single atoms,” http://nanotechweb.org/cws/article/tech/50459.
[8]Longo Pet al., Microscopy Today 21(1) (2013) 2833.
[9]Gubbens AJet al., Ultramicroscopy 110 (2010) 962970.
[10]Scott Jet al., Ultramicroscopy 108 (2008) 15861594.
[11]Longo Pet al., Microsc Microanal 20 (2014) 779783.
[12]Pakzad A. Gatan Inc., "Argon Ion Polishing of Focused Ion Beam Specimens in PIPS II System," Application note, 2014, http://info.gatan.com/acton/attachment/11413/f-0122/1/-/-/-/-/AppNote%20PIPS%20II%20Argon%20Ion%20Polishing%20FL1.pdf.
[13]Lazar Set al., Microsc Microanal 16 (2010) 416424.
[14]Riegler K and Kothleitner G, Ultramicroscopy 110 (2010) 10041013.
[15]Longo P. Gatan Inc., Application Note, 2011, “The use of MLLS fitting approach to resolve overlapping edges in the EELS spectrum at the atomic level,” http://info.gatan.com/acton/attachment/11413/f-01a1/1/-/-/-/-/Use_of_MLLS_fitting_EELS_FL1.pdf.
[16]Lifshin E. Proc 9 thAnn Conf Microbeam Anal Soc, Ottawa, Canada, 1974, paper no. 53.
[17]Van Grieken R and Markowicz A, Handbook of X-ray Spectrometry. Marcel Dekker, Inc., New York, 2001.
[18]Botton GAet al., Ultramicroscopy 110 (2010) 926934.
[19]Egerton RF, Electron Energy-Loss Spectroscopy in the Electron Microscope, 2nd Edition, Plenum Press, New York, 1996.
Recommend this journal

Email your librarian or administrator to recommend adding this journal to your organisation's collection.

Microscopy Today
  • ISSN: 1551-9295
  • EISSN: 2150-3583
  • URL: /core/journals/microscopy-today
Please enter your name
Please enter a valid email address
Who would you like to send this to? *
×

Metrics

Full text views

Total number of HTML views: 8
Total number of PDF views: 60 *
Loading metrics...

Abstract views

Total abstract views: 143 *
Loading metrics...

* Views captured on Cambridge Core between September 2016 - 21st November 2017. This data will be updated every 24 hours.