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Atomic Elemental and Chemical Analysis of SrTiO3/LaMnO3 Multilayers Using Fast Simultaneous EELS and EDS Analysis in DigitalMicrograph

  • Paolo Longo (a1), Paul J Thomas (a1), Aziz Aitouchen (a1), Phil Rice (a2), Teya Topuria (a2) and Ray D Twesten (a1)...
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*plongo@gatan.com
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This list contains references from the content that can be linked to their source. For a full set of references and notes please see the PDF or HTML where available.

[1] OL Krivaneck et al., Ultramicroscopy 96 (2003) 229237.

[3] P Longo et al., Microsccopy Today 20(4) (2012) 3036.

[4] P Longo et al., Microscopy Today 21(4) 2013) 3640.

[5] P Schlossmacher et al., Microscopy Today 18 (2010) 1420.

[6] PJ Phillips et al., Microsc Microanal 20 (2014) 10461052.

[9] AJ Gubbens et al., Ultramicroscopy 110 (2010) 962970.

[10] J Scott et al., Ultramicroscopy 108 (2008) 15861594.

[11] P Longo et al., Microsc Microanal 20 (2014) 779783.

[13] S Lazar et al., Microsc Microanal 16 (2010) 416424.

[14] K Riegler and G Kothleitner , Ultramicroscopy 110 (2010) 10041013.

[17] R Van Grieken and A Markowicz , Handbook of X-ray Spectrometry. Marcel Dekker, Inc., New York, 2001.

[18] GA Botton et al., Ultramicroscopy 110 (2010) 926934.

[19] RF Egerton , Electron Energy-Loss Spectroscopy in the Electron Microscope, 2nd Edition, Plenum Press, New York, 1996.

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Microscopy Today
  • ISSN: 1551-9295
  • EISSN: 2150-3583
  • URL: /core/journals/microscopy-today
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