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Imaging Gas-Solid Interactions in an Atomic Resolution Environmental TEM

Published online by Cambridge University Press:  14 March 2018

Xiao Feng Zhang  and
Takeo Kamino
Xiao Feng Zhang*
Affiliation:
Hitachi High Technologies America, Pleasanton, CA
Takeo Kamino
Affiliation:
Hitachi High Technologies Corp., Hitachinaka, Ibaraki, Japan
*
Xiao.zhang@hitachi-hta.com

Extract

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It is well known that analysis using transmission electron microscopes (TEM) yields very high resolution images of thin specimens. However, the applicability of TEM analysis is not universal due to the requirement that a high internal vacuum is required. This high vacuum precludes the TEM study of living specimens or specimens in a gas or liquid environment. In order to tackle this problem, L. Marton of Universite Libre in Brussels, Belgium was the first to design an environmental cell (E-cell) in 1935 that was sealed in the tip of a TEMsample holder [1]. Marton's design included two 0.5 μm aluminum foils as upper and lower windows sandwiching a biological sample to sustain a living environment. The electron transparent windows permitted the confined biological objects to be imaged in TEMmode. Since then, environmental TEM (E-TEM) has received increasing attention from biological scientists and eventually from materials scientists as well.

Type
Research Article
Information
Microscopy Today , Volume 14 , Issue 5 , September 2006 , pp. 16 - 19
Copyright
Copyright © Microscopy Society of America 2006

References

References:

1. Marton, L., “ElectronMicroscopy of Biological Objects”, Nature 133 (1934) 911.Google Scholar
2. Kamino, T., and Saka, H., “Newly developed high resolution hot stage and its application to materials science”, Microsc. Microanal. Microstruct. 4 (1993) 127–135 Google Scholar
3. Kamino, T., Yaguchi, T., Konno, M., Watabe, A., Marukawa, T., Mima, T., Kuroda, K., Saka, H., Arai, S., Makino, H., Suzuki, Y. and Kishita, K., “Development of a gas injection/specimen heating holder for use with transmission electron microscope”, J. of Electron Microscopy 54 (2005) 497.Google Scholar