Hostname: page-component-848d4c4894-pftt2 Total loading time: 0 Render date: 2024-06-08T00:22:46.414Z Has data issue: false hasContentIssue false

Introduction to Automated Particle Analysis

Published online by Cambridge University Press:  14 March 2018

T.B. Vander Wood*
Affiliation:
MVA, Inc.

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

A microscopist is presented with a special problem when asked to characterize a population of particles. In order to adequately describe the sample, it may be necessary to examine hundreds or even thousands of individual particles, recording the size, shape, identity or other parameters of interest. To manually characterize a statistically significant fraction of the sample could require many hours of tedious work at the scope, followed by still more tedious hours of data reduction. What is needed is a technique to automate the repetitive parts of this process; the recognition and characterization of particles in the sample and the reduction of data and presentation of results. This technique is automated particle analysis.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 1995

References

Moore, G.A. et al., in DeHoff, R.T. and F.N., Rhines, eds., Quantitative Microscopy, New York: McGraw Hill (1968) 381.Google Scholar
Lee, R.J. and Fisher, R.M., NBS Spec. Publ . 533 (1980] 63.Google Scholar
Kelly, J.F. et al., SEM/1980 , 1 (1980) 311.Google Scholar
Frteetal, G.S.., in Geiss, R.H., ed., Microbe-am Analysis-1981, San Francisco: San Francisco Fress, (1981) 57.Google Scholar
JSS, J.C. R , Computer Assisted Microscopy, NewYork Piercum Press, (1990).Google Scholar
Germani, M.S. and Buseck, P.R., Anal. Chem : 63 (1991) 2232.Google Scholar
Germani, M.S., Jour For. Sci ., 36 (1991) 331.Google Scholar
Wood, T.B. Vander and Detter-Hoskin, L.D., in Mittal, K.L., ed., Proceedings of the Second Symposium on Particles in Gases and Liquids. New York: Plenum Press, (1990)Google Scholar
Vander Wood, T. B. and Boltin, W.R.. in Hausen, D.M., et al.. eds.. Process Mineralogy XI, TMS (1991)37.Google Scholar
Vander Wood, T.E., Proc. Ann. EMSA Meeting 50 (1992) 1492.Google Scholar
Hefter, J. and Sterili, L., Part. Sci and Tech., 10 (1992) 91 Google Scholar
Russ, J.C., The Image Processing Handbook, Boca Raton: CRC Press, (1992.)Google Scholar
Shattuck, T.V. V et al.. Anal. Chem ., 63 (1991) 2646.Google Scholar