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Precision Attachment of (Silica) Spheres to AFM Cantilever Tips

Published online by Cambridge University Press:  14 March 2018

Shane Huntington  and
Ms Sarah Nespolo
Shane Huntington*
Affiliation:
University of Melbourne
Ms Sarah Nespolo
Affiliation:
University of Melbourne
*
shaneth@unimelb.edu.au

Extract

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Over the past decade the Atomic Force Microscope has been utilised in a myriad of applications across many fields of research and industry. One area that has been of particular interest is the measurement of small scale forces. The AFM is capable of measuring electrostatic and van der Waals forces with high precision based on small deflections of the AFM cantilever.

The forces between colloidal particles dominate the behaviour of a great variety of materials. The AFM has been extensively used to measure the forces between planar surfaces and individual colloid particles. One of the key driving forces for such experiments and the corresponding theoretical framework that has ensued is the ease of use of standard AFM tips for such measurements.

Type
Research Article
Information
Microscopy Today , Volume 9 , Issue 3 , April 2001 , pp. 32 - 33
Copyright
Copyright © Microscopy Society of America 2001

References

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