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Preparation of Cross Sections of Difficult Materials for SEM Imaging

  • Scott A. Payne (a1) and Jayma A. Moore (a1)
Abstract

Preparing cross sections of particulates and wires for scanning electron microscopy study without inducing mechanical damage is difficult. Embedding materials in commercially available epoxy before polishing with a broad unfocused ion beam is a simple and inexpensive way to produce a cross section with minimal preparation artifacts. A stepwise procedure is provided for embedding and polishing powders, larger particles, and wires.

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Corresponding author
* jayma.moore@ndsu.edu
References
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[1] Erdman, N et al., Adv Mater Process 164(6) (2006) 3335.
[2] Erdman, N et al., Microscopy Today 14(3) (2006) 2225.
[3] Erdman, N et al., Adv Mater Process 168(2) (2010) 1415.
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Microscopy Today
  • ISSN: 1551-9295
  • EISSN: 2150-3583
  • URL: /core/journals/microscopy-today
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