Preparing cross sections of particulates and wires for scanning electron microscopy study without inducing mechanical damage is difficult. Embedding materials in commercially available epoxy before polishing with a broad unfocused ion beam is a simple and inexpensive way to produce a cross section with minimal preparation artifacts. A stepwise procedure is provided for embedding and polishing powders, larger particles, and wires.
Email your librarian or administrator to recommend adding this journal to your organisation's collection.
* Views captured on Cambridge Core between 8th May 2018 - 20th July 2018. This data will be updated every 24 hours.